Aug 2015KEYENCE MicroscopesRequest Info
ITASCA, Ill., Aug. 27, 2015 — Using advanced optics and image processing, the XM series of handheld probe coordinate measuring machines from Keyence Corp. of America allows intuitive 3D measurement with high accuracy.
The devices can be implemented in any manufacturing environment due to their portability and robust design. They operate in the ranges of 50 to 95 °F and 20 to 80 percent relative humidity. Operation does not require any foundation or ancillary equipment.
Augmented reality guidance images are created automatically, with measurement points and 3D elements visually overlaid.