MIDDLEFIELD, Conn., Aug. 27, 2015 — Zygo Corp. has announced the Verifire HD high-resolution Fizeau interferometer for surface form and wavefront metrology of optical components and systems. The phase-shifting metrology instrument performs advanced characterization of precision optical surfaces. A high-resolution camera and optimized optical design characterize midspatial frequency content in optical surfaces. Surface form measurement and analysis, curvature radius, and transmitted wavefront quality are supported by the company’s Mx metrology software. Verifire is equipped with Zygo’s QPSI vibration-robust acquisition technology, enabling the system to maintain a high level of measurement accuracy in vibration-prone environments.