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Optical Inspection System

Photonics.com
Nov 2015
Saki America Inc.
 
FREMONT, Calif., Nov. 3, 2015 — Optical Inspection SystemsOptical inspection systems from Saki America Inc. feature a newly designed gantry and come in three configurations and sizes, with a dual-lane model and a 3D scanning head with side camera option.

The systems provide measurements with 1-μm resolution for components with heights up to 20 mm. It can be used to captures printed circuit board defects such as lifted leads, tombstones, reverses and height variations.


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