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EUV Spectrometer

Photonics.com
Dec 2015
McPhersonRequest Info
 
CHELMSFORD, Mass., Dec. 10, 2015 — XUV SpectrometerMcPherson Inc. has announced the Model 248/310 high-energy grazing-incidence wavelength-dispersive extreme-ultraviolet (EUV) spectrometer, allowing rapid analysis of light in the 1- to 300-nm wavelength region.

Beside high-harmonic laser generation experiments, the device is also useful for measuring ion or discharge light sources and astrophysics detector calibration. The spectrometer uses angles between 84° and 88.5° throughput to energies around 1200 eV.

The device is designed for space scientists and plasma physicists who require an instrument for vacuum-ultraviolet and EUV applications. Configured in reverse, the Model 248/310 operates as a tunable light source, useful for spectral calibration and spectroscopy in the vacuum-ultraviolet, EUV and soft x-ray wavelength regions.


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