AccuFiz SIS Laser Interferometer
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The AccuFiz Laser Interferometer is compact, lightweight and extremely rigid, for maximum stability in any orientation or environment.
The new AccuFiz Surface Isolation Source interferometer includes a second, external, short coherence laser to isolate and measure plane parallel optical surfaces. Use the AccuFiz SIS to measure the surfaces, wedge, homogeneity and optical thickness of afocal optics. Then, switch easily to the standard source to measure a wide range of focal and afocal optics, like a standard Fizeau interferometer.
AccuFiz provides industry leading repeatability in production environments as well as in the lab. Only AccuFiz includes Smart Zoom™ to ensure accurate lateral resolution over the entire 1X–10X zoom range. Diffraction-limited imaging provides unparalleled resolution, particularly at mid-spatial frequencies, to measure polishing artifacts that other interferometers miss.
The AccuFiz is built to excel in challenging conditions. With the industry’s only continuously adjustable extended source you can optimize for test conditions and reduce artifacts from dust and aberrations, resulting in extremely low measurement noise. On the shop floor or in a clean room, optional Dynamic Interferometry® enables extremely short exposure times so you can measure despite vibration, without isolation.
Wireless remote control makes it easy to set up long path measurements and to minimize disturbance of the optical path. You can even control the system from an Android device or iPhone.
The AccuFiz line includes wavelengths from 355nm to 10.6μm, apertures from 33 – 800mm, horizontal and vertical mounting configurations, and a high resolution option for measuring aspheres and highly aberrated elements, providing the right options for a wide range of applications and budgets.
See us as SPIE Optics & Photonics, Booth #241.