May 2016FLIR Systems Inc.
WILSONVILLE, Ore., April 29, 2016 — Flir Systems Inc. has announced the X8000sc series of thermal imaging cameras with lock-in, transient and pulse capabilities to perform advanced inspections such as nondestructive testing or stress mapping that resolve temperature differences as low as 1 mK.
The cameras detect internal defects though target excitation and the observation of thermal differences on a target’s surface. They also detect defects and points of failure in composites, solar cells, bridges and electronics, as well as enabling thermal mapping of stress when performing materials testing.
The devices are designed to provide the best thermal measurement performance for scientists, engineers and researchers with thermal images up to 1280 × 1024 pixels, enabling users to see the smallest of details with excellent measurement accuracy.
- A light-tight box that receives light from an object or scene and focuses it to form an image on a light-sensitive material or a detector. The camera generally contains a lens of variable aperture and a shutter of variable speed to precisely control the exposure. In an electronic imaging system, the camera does not use chemical means to store the image, but takes advantage of the sensitivity of various detectors to different bands of the electromagnetic spectrum. These sensors are transducers...
MORE FROM PHOTONICS MEDIA