Search
Menu
Gentec Electro-Optics Inc   - Measure With Gentec Accuracy LB

CMM Compact Probes

Hexagon Manufacturing IntelligenceRequest Info
 
Facebook X LinkedIn Email
CMM Compact ProbesHexagon Manufacturing Intelligence has announced the HP-S-X1 series of compact probes for 3D coordinate measuring machine tactile scanning.

The HP-S-X1 product line features a new bearing system for better joint repeatability and accepts longer horizontal styli for improved flexibility. Operators do not need to change modules to tackle different measurement tasks, as the probes support stylus lengths of up to 225 mm.

The probes feature small external dimensions and longer stylus lengths to measure surface features of complex parts, as well as bores or holes deep inside a workpiece, saving time during the inspection process. Magnetic interfaces allow for automated stylus changes on the coordinate measuring machine. The probe range supports all standard inspection modes including dynamic single-point contact measurement, self-centering measurement and continuous high-speed scanning for quick and precise data acquisition of various surface contours.


Published: June 2016
REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:


When you click "Send Request", we will record and send your personal contact information to Hexagon Manufacturing Intelligence by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required

Productscompact measuring machine probesHP-S-X1Hexagon Manufacturing IntelligenceEuropeCMMmanufacturingindustrialinspectionTest & Measurementmetrology

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.