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Microscopy Simplification System

Photonics.com
Jul 2016
Hitachi High-Technologies Corp.Request Info
 
TOKYO, July 29, 2016 — Microscopy Simplification SystemHitachi High-Technologies Corp. has announced the MirrorCLEM system for simplifying correlative light and electron microscopy.

The system supports quick and accurate correlative light electron microscopy (CLEM) analysis by using a field emission scanning electron microscope (FE-SEM). With this system, the plastic sections can be observed under a light microscope from low magnifications to magnifications that are high enough to clearly observe the structure of interest. In addition, the FE-SEM stage can be coordinated to the target position in the low-magnification image which is observed with the light microscope.

The field of view in a FE-SEM can move to any region of interest in the image and the same field can be observed in the FE-SEM under the MirrorCLEM system. The system is capable of displaying an overlay of the light microscope and FE-SEM images in real time.


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