Microscopy Simplification System
Hitachi High-Tech Corp.Request Info
Hitachi High-Technologies Corp. has announced the MirrorCLEM system for simplifying correlative light and electron microscopy.
The system supports quick and accurate correlative light electron microscopy (CLEM) analysis by using a field emission scanning electron microscope (FE-SEM). With this system, the plastic sections can be observed under a light microscope from low magnifications to magnifications that are high enough to clearly observe the structure of interest. In addition, the FE-SEM stage can be coordinated to the target position in the low-magnification image which is observed with the light microscope.
The field of view in a FE-SEM can move to any region of interest in the image and the same field can be observed in the FE-SEM under the MirrorCLEM system. The system is capable of displaying an overlay of the light microscope and FE-SEM images in real time.
http://www.hitachi-hightech.com
/Buyers_Guide/Hitachi_High-Tech_Corp/c28317
Published: July 2016
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