OBERKOCHEN, Germany, Aug. 26, 2016 — Carl Zeiss AG has announced FPX flat panel extension for the Xradia Versa 500-series of 3D X-ray microscopes, delivering large-sample, high-throughput scanning. Combined with the high resolution of Xradia Versa X-ray microscopes (XRM), the new ZEISS FPX enhances imaging flexibility and creates workflow efficiencies with an all-in-one system for industrial development and academic research. The system enables engineering, development and researchers to scout large samples faster to identify a region of interest and then zoom to image areas at high resolution with the Xradia Versa RaaD dual magnification microscope objectives that enable resolution at a distance. FPX extends the ability for Xradia Versa XRM to achieve full field of view, whole- sample imaging, up to 5 in in diameter for samples 10x greater in volume with higher throughput. Applications include use in the oil and gas, medical device, materials and life sciences fields.