Scanning Electron Microscope
Sep 2016Carl Zeiss AG, Camera LensesRequest Info
OBERKOCHEN, Germany, Sept. 14, 2016 — Carl Zeiss AG has announced the Sigma HD VP scanning electron microscope with field emission FE-SEM technology.
Ideal for failure analysis of materials and manufactured components, imaging and analysis of steels and metals, and semiconductor and electronics quality assurance, the Sigma HD VP is also an excellent choice for medical device inspection.
EDS geometry delivers high analytical performance. Featuring high vacuum and variable pressure operation modes for high-definition imaging of conducting and nonconducting samples, the SIGMA HD increases resolution to 1 nm.