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OPTICAL MATERIALS CHARACTERIZATION

Photonics Spectra
May 2000
Hinds Instruments Inc.Request Info
 
tCHARACTERA birefringence measuring system for characterizing optical materials is available from Hinds Instruments Inc. The Exicor 150AT measures the retardation of linear birefringence with ±0.005-nm sensitivity and the direction of birefringence with an accuracy of <1° for retardance greater than 0.5 nm. It uses a polarization modulation technique that provides 1-s measuring times and 50-kHz modulation frequency. The standard instrument can accept optical samples up to 6 x 6 in., with an option for 12 x 12-in. samples. The device maps materials from the ultraviolet to the infrared, displaying data in 2- and 3-D images. Applications include quality control metrology; qualification of semiconductor photolithography components such as calcium fluoride windows, fused-silica optics and stepper reticles; and low-level birefringence measurements of plate glass, scientific optical components, digital videodiscs and laser crystals.


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