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MadAFM sample scanning AFM

Mad City Labs Inc.Request Info
 
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Mad City Labs Inc. - MadAFM™ sample scanning AFM The MadAFM is a new multimodal sample scanning AFM. Simple to install with compact tabletop design. Includes Mad City Labs picometer precision nanopositioning systems to give outstanding AFM performance. User-friendly AFMView® software features automated calibration and initialization. MadAFM is compatible with MountainsSPIP® and Gwyddion analysis software.



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ProductsAFMatomic force microscopyscanning probe microscopyMaterialsmetrologycharacterizationphysicssurface scienceforce microscopyMicroscopy

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