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Featured White Papers
Vision Library or Vision-Specific IDE: Which is right for you?
Matrox Imaging, Division of Matrox Electronic Systems Ltd.
Commercial machine vision software is currently classified along two lines: the conventional vision library and the vision-specific integrated development environment (IDE). Determining which software is right for your vision project depends upon a variety of factors: ease-of-use, productivity, flexibility, performance, completeness, and maintenance. This white paper uses these factors to...
Wednesday, January 16, 2013
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The Measurement of High Optical Densities (up to 8 Abs) in the Near-Infrared
Agilent Technologies, Inc., Nano Positioning Metrology Div.
The optical densities of various materials used in the manufacture of laser safety eyewear have been determined in the NIR. The lens materials were measured over wavelength ranges corresponding to the laser wavelengths for which the eyewear was designed (InGaAs, 980 nm and Nd:YAG, 1064 nm). Prior to measurement, a variety of filters of known optical density were used to validate the photometric...
Wednesday, April 03, 2013
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Edmund Optics, Inc.
Gentec-EO USA Inc. - Sub. of Gentec Electro-Optics, Inc.
JENOPTIK Optical Systems, Inc. - Div. of JENOPTIK AG
Konica Minolta Sensing Americas, Inc. - Sub. of Konica Minolta Holdings
Luna Technologies - Div. of Luna Innovations Inc.
Master Bond Inc.
Matrox Imaging - Div. of Matrox Electronic Systems Ltd.
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PI (Physik Instrumente) L.P. - Sub. of Physik Instrumente (PI) GmbH & Co. KG - Piezo Nano Positioning
Polymicro Technologies - Sub. of Molex, Inc.
Semrock, Inc. - Unit of IDEX Corp.
Shimadzu Scientific Instruments, Inc. - Sub. of Shimadzu Corp.
Sofradir-EC Inc. - Sub. of Sofradir
Teledyne DALSA - A Teledyne Technologies Co. - Machine Vision OEM Components
Telops Inc.
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White Papers
Metrology of Advanced Optical Modulation Formats
The fundamental methods of encoding digital information onto an optical carrier are identical to the methods that have been developed and are widely used in the RF and wireless world. The only...
Friday, January 08, 2010
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High Speed Infrared Cameras Enable Demanding Thermal Imaging Applications
Recent developments in cooled MCT infrared detectors have made possible the development of high-performance IR cameras for use in a wide variety of demanding thermal imaging applications.This paper...
Monday, August 09, 2010
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An Introduction to Diode Lasers for Materials Processing
Low-power diode lasers are a well established technology, used extensively in products such as DVD players, computer optical drives, fiber-optic telecommunications and even laser pointers. While...
Friday, January 08, 2010
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Measuring Polarization Dependent Loss of Passive Optical Components
The determination of polarization dependent loss has become a standard measurement when characterizing passive optical components. In optical networks, where polarization is not constrained and...
Monday, January 18, 2010
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Automated Inspection Lowers Solar Cell Costs
The solar cell market is poised to experience exceptional growth, but continued success in the market will require manufacturers to drive production costs down. Automated optical inspection (AOI)...
Thursday, May 13, 2010
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Hollow Silica Waveguides for Mid-Infrared Power Transmission and Spectroscopy
Applications in the Mid-Infrared often require a flexible conduit for transmitting light from source to destination. Hollow Silica Waveguides with an internal Ag/AgI dielectric reflective layer...
Wednesday, March 27, 2013
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Understanding Infinity-Corrected Objective Resolving Power and Magnification
This informative white paper from Edmund Optics covers a range of topics from the field of Microscopy, including terminology, application examples, and descriptions of different types filters such as...
Monday, April 22, 2013
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Vision Library or Vision-Specific IDE: Which is right for you?
Commercial machine vision software is currently classified along two lines: the conventional vision library and the vision-specific integrated development environment (IDE). Determining which...
Wednesday, January 16, 2013
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Reliable High-bandwidth Video Capture
Applications with image resolutions, data rates and analysis requirements that exceed the capabilities of a typical workstation computer continue to exist to this day. Moreover, developers must...
Tuesday, October 04, 2011
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Cladding with High Power Diode Lasers
This article provides an introduction to high-power diode laser technology and its use in cladding. In particular, it compares the capabilities and characteristics of diode lasers with traditional...
Tuesday, February 23, 2010
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Super-resolution Microscopy
This article provides an overview of some of the key developments in super-resolution microscopy -- the art of enhancing the diffraction-limited resolution of an optical microscope.
Thursday, May 19, 2011
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Low Outgassing Materials for Electro-Optic and Electronic Systems
Many military and commerical applications require low-outgassing materials, which provide flexibility, stress relief, thermal stability, moisture resistance and other benefits. Low-outgassing...
Wednesday, April 21, 2010
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Optical Vector Network Analyzer for Single Scan Measurements of Loss, Group Delay and Polarization
The Jones matrix (JM) or linear transfer function (TF) of a fiber-coupled component, when measured as a function of frequency, contains all of the information required to predict final component...
Thursday, February 11, 2010
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Thin Substrate, Dichroic and Polychroic Thin Film Filters Featuring Flatness <0.1 Waves RMS
The filters used by fluorescence detection systems are arguably the most important element defining the system performance. Alluxa’s new line of thin substrate ultra-flat dichroics and polychroic...
Tuesday, January 22, 2013
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New Broad Spectrum Fiber for Fiber Sensor and Spectroscopy Applications
Polymicro Technologies has developed a new broadband optical fiber which exhibits the UV performance of a high -OH fiber and the NIR performance of a low -OH fiber. This fiber is optimized for...
Monday, April 02, 2012
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PMD Tolerance Testing of Optical Interfaces
Improving the tolerance to polarization mode dispersion (PMD) is considered to be one of the major prerequisites for the success of modern high bit rate optical communication systems. Various...
Monday, January 18, 2010
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High Speed Lightwave Component Analysis
As lightwave transmission systems become more advanced, component designers and manufacturers must maximize the performance of their devices. For example, one parameter often used to specify digital...
Monday, January 18, 2010
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Pixel Size & Sensitivity
The relationship between pixel size of an image sensor and its sensitivity is discussed in detail to illuminate the reality behind the myth that larger pixel image sensors are always more sensitive...
Wednesday, October 17, 2012
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IL and PDL spectra with the N7786B Polarization Synthesizer and the N7700A Photonic Application Suite
The spectral measurement of optical insertion loss (IL) and polarization dependent loss (PDL) as well as the related parameter for reflected light, return loss (RL), provides the primary performance...
Monday, January 18, 2010
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Real-time Characterization of Smoke Candles Using Infrared Hyperspectral Imaging
The development of efficient countermeasure devices like flares and smoke candles requires detailed characterization in order to suit their proper application. However, the gas clouds produced by...
Thursday, April 19, 2012
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The Measurement of High Optical Densities (up to 8 Abs) in the Near-Infrared
The optical densities of various materials used in the manufacture of laser safety eyewear have been determined in the NIR. The lens materials were...
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Hollow Silica Waveguides for Mid-Infrared Power Transmission and Spectroscopy
Applications in the Mid-Infrared often require a flexible conduit for transmitting light from source to destination. Hollow Silica Waveguides with...
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Clearly Superior Epoxies for Optical Applications
As technology in the optics industry continues to advance and improve, careful consideration of the properties of epoxies must be evaluated. When...
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