SiriusSD, an electrically cooled solid-state silicon drift detector, has been unveiled by e2v technologies plc’s Scientific Instruments Div. The device includes designs for integration with scanning electron microscopes and x-ray fluorescence systems to perform detailed elemental analysis of materials on a microscopic level. The detectors are compatible with existing systems and, because they produce an industry-standard signal output, facilitate upgrading of energy-dispersive x-ray analysis equipment. The company says that the Peltier-cooled devices achieve stability of peak position and resolution over a wide range of input count rates.

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