For use by industrial, institutional and academic researchers for characterizing the atomic-scale structure, chemistry and dynamics of individual nanostructures, the Titan³ 80-300 scanning/transmission electron microscope (STEM) has been announced by FEI Co. It has a fully enclosed profile, and its design combines two aberration correctors and a monochromator on a single instrument. The two correctors enable studies in STEM mode with a focused probe and in TEM mode with a parallel beam with sub-Ångstrom resolution on the same specimen area in the same microscope. Acceleration voltage is between 80 and 300 kV. The digital user interface enables remote operation in ambient conditions.

To contact the manufacturer of this product, click here.

Start a discussion on this article or any photonics topic in the Photonics.com Community Forum