Hyphenated Systems LLC has unveiled the HS200A NanoScale optical profiler, an enhancement of its HS200OP model. The new version adds automation capability and uses the company’s patented Advanced Confocal Microscopy technology that acquires and displays high-resolution (<50 nm) images within seconds. The system is designed for 3-D imaging and metrology of rough or sloped surfaces of microelectromechanical systems and other semiconductor devices. It is targeted for nondestructive analyses in metrology, inspection and quality control applications.

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