PerkinElmer Inc. has introduced the attenuated total reflectance image accessory for its Spotlight FT-IR 400 imaging system. It provides high-quality data and maximizes the available imaging area. It can resolve material sample features as small as 3.1 μm. Applications include troubleshooting in chemical and pharmaceutical manufacturing labs, research in academic and biomedical labs, and forensics imaging. The device has a germanium crystal with a 600-μm-diameter sample area.

To contact the manufacturer of this product, click here.

Start a discussion on this article or any photonics topic in the Photonics.com Community Forum