Leica Microsystems Cambridge Ltd. has released a version of its QWin image analysis software that supports all automated microscope functions and provides interactive dialogues for single-click control. With separate calibration control for live and stored images, the upgrade immediately updates the calibration of the stored images when a new one is acquired. Features include extended focus, tile scan, overlay and time-lapse imaging, complete X-Y-Z specimen movement control, choice of scanning patterns, recall stage positions and autofocus.

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