The Photon ModeScan Model 1780 beam profiling system from Photon Inc. measures the M² beam propagation ratio and associated ISO 11146 parameters in real time. It uses a patented technique with 10 reflective surfaces to form 10 simultaneous images of the beam onto a CCD detector array. It measures and updates M² and other beam parameters at a rate of better than 20 Hz, and it analyzes continuous-wave, pulsed and single-shot lasers over the wavelength range of 250 to 1100 nm. The portable device measures 62 × 140 × 210 mm and has a FireWire interface. The company measured the M² parameter of a single laser more than 1 million times to demonstrate the speed of the system. The instrument generates NIST-traceable measurements.

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