PhaseView has launched the SurPhase 3-D topography instrument based on the company’s proprietary Digital Phase Technology. The device is suitable for surface characterization and 3-D measurements that include profiles, heights, roughness and waviness parameters. It uses few optical components and relies on digital algorithms to produce topography images in <5 s with nanometer-scale resolution. Image processing time is <2 s. Combining 2-D video microscopy and automated 3-D microtopography, the fully certified stand-alone system provides data according to international standards.

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