The IREM-II PE launched by IRLabs Inc. is an infrared emission microscope that provides back-side failure analysis, yield enhancement and debug in the near-IR. It uses a proprietary high-sensitivity InGaAs focal plane array and high-numerical-aperture optics to increase the precision of fault localization. Optimized for photoemission applications between 1 and 1.5 μm, it detects faint emissions of sub-1-V devices in a short integration time. A liquid nitrogen Dewar with a capacity of 1 l and maintained by an automatic-fill system provides cryogenic cooling of the IR detector and associated optics for unattended continuous operation.

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