Dalsa Corp. has introduced additional features to its Falcon 4M60 area-scan camera that are designed to expand its applicability to the electronics inspection, machine vision and imaging industries. The features include a snapshot mode that enables immediate image acquisition based on internal or external trigger events, a controlled integration time that is useful for wafer inspections because it permits controlled exposures down to 10 μs, and a higher transmission speed that drives signals >10 m via Camera Link.

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