Veeco Instruments Inc. has developed the HarmoniX atomic force microscope (AFM) technique by which users can simultaneously capture quantitative maps of material properties such as elasticity, adhesion, dissipation and peak force. It is available on all of the company’s scanning probe microscopes that are powered by the NanoScope V controller and probes. HarmoniX acquires real-time force curves by measuring the cantilever’s torsional motion each time the AFM tip interacts with the surface, and proprietary analyses instantly calculate sample characteristics and provide results in image maps that correlate to the sample topography image.

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