Horiba Jobin Yvon introduces the new MM-16, a highly accurate and affordable spectroscopic ellipsometer. Along with measurements of thin-film thickness and optical constants, the MM-16 delivers -- in two seconds -- the complete 16 elements of the Mueller matrix in the visible to near-infrared spectral range (420 nm – 850 nm).

Combined with the embedded analysis software DeltaPsi2, this additional capability allows easy characterization of retardation, anisotropy and degree of depolarization. These complex materials properties are widely used in TFT-LCD (thin-film transistor LCD) and OLED (organic LED) structures.

With the addition of an automatic variable angle of incidence and a computer-controlled X-Y mapping stage, the MM-16 is the ideal spectroscopic ellipsometer for simple, fast and accurate measurements of your multilayer film thickness and optical constants.