A unique collection of technical design and applications articles, as well as technology primers presenting the basics of the photonics technology.
A Fast, Simple, Accurate Tool
Broadband spectrophotometers coupled with relatively simple algorithms can provide fast, nondestructive and comprehensive characterization of thin films. Designing devices that incorporate ultrathin films is an important means of enhancing yields. However, characterizing ultrathin films provides a challenge for mainstream metrology tools such as ellipsometers, interferometers and profilometers. One innovative approach is broadband spectrophotometry. When used along with an appropriate...