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Photonics Dictionary

  • atomic force microscope (AFM)

A type of microscope that produces a quantitative, three-dimensional image of the surface of a sample. The surface is scanned by an extremely sharp tip mounted to a flexible cantilever. The atoms on the tip interact with the atoms on the surface of the sample, causing a deflection of the cantilever; this deflection is monitored and used to generate the image.
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