http://www.photonics.com/Splash.aspx?TID=61 This is the syndication feed for photonics.com. OptiPro Systems LLC has enhanced the capabilities of its OptiTrace 5000 aspheric profilometer data analysis software to include multiple-profile loadi http://www.photonics.com/Article.aspx?AID=53961 Fri, 24 May 2013 00:00:00 GMT Prior Scientific Inc. has extended its line of motorized high-precision microscope stages with the H101F flat-top stage for upright microscopes. http://www.photonics.com/Article.aspx?AID=53951 Thu, 23 May 2013 00:00:00 GMT Carl Zeiss has introduced a FalconEye optical sensor that can be used on stepping, articulating probe holders and is suitable for complex measuring an http://www.photonics.com/Article.aspx?AID=53948 Thu, 23 May 2013 00:00:00 GMT The OPAL IR system is a very fast and accurate system for measuring MTF and other optical parameters in the infrared spectral region. A single-element http://www.photonics.com/Article.aspx?AID=53939 Wed, 22 May 2013 00:00:00 GMT The Scan XY40 piezoelectric actuating stage from piezosystem jena offers a travel range of 40 µm per axis and is suitable for 2-D scanning appli http://www.photonics.com/Article.aspx?AID=53932 Wed, 22 May 2013 00:00:00 GMT Asylum Research’s new MFP-3D Origin atomic force microscope (AFM) has full upgrade potential to the MFP-3D and its complete range of environment http://www.photonics.com/Article.aspx?AID=53929 Wed, 22 May 2013 00:00:00 GMT Flir Systems’ microscopy stand is a complete solution for thermal evaluation of small objects such as electronic and photovoltaic components. http://www.photonics.com/Article.aspx?AID=53922 Tue, 21 May 2013 00:00:00 GMT Patterning nanoantennas with “slots” that correspond to wavelengths in the mid-IR has yielded a new way to tune IR light into mechanical a http://www.photonics.com/Article.aspx?AID=53921 Tue, 21 May 2013 00:00:00 GMT Ophir Photonics, a Newport Corp. brand, has announced a new addition to its line of high-power laser detectors: the 30K-W laser power meter. The devic http://www.photonics.com/Article.aspx?AID=53920 Tue, 21 May 2013 00:00:00 GMT Ocean Optics’ IDRaman, a palm-sized Raman spectrometer for sample authentication and counterfeit detection, delivers fast analyses ranging from http://www.photonics.com/Article.aspx?AID=53919 Tue, 21 May 2013 00:00:00 GMT A new full-spectrum endoscopy system that gives doctors a 330-degree view during colonoscopies may help them miss fewer adenomas during exams, accordi http://www.photonics.com/Article.aspx?AID=53910 Mon, 20 May 2013 00:00:00 GMT Customizable OceanView spectroscopy software from Ocean Optics combines data-processing capabilities with a graphical user interface to provide a visu http://www.photonics.com/Article.aspx?AID=53902 Thu, 16 May 2013 00:00:00 GMT PolyScience’s three lines of compact, low-temperature chillers maximize bench space and provide up to 1290 W of cooling at 20 °C, making the http://www.photonics.com/Article.aspx?AID=53897 Thu, 16 May 2013 00:00:00 GMT With a worldwide market value projected to hit €615 billion (about $791 billion) in 2020 and to remain stronger than the gross domestic product ( http://www.photonics.com/Article.aspx?AID=53894 Wed, 15 May 2013 00:00:00 GMT The TechSpec broadband-coated λ/10 first-surface mirrors from Edmund Optics provide >99% reflection for application in the visible to near-i http://www.photonics.com/Article.aspx?AID=53893 Wed, 15 May 2013 00:00:00 GMT Armstrong Optical Ltd. has introduced PV-LIT, a fully automatic optronic IR test system manufactured by InfraTec GmbH in Germany for use in solar cell http://www.photonics.com/Article.aspx?AID=53891 Wed, 15 May 2013 00:00:00 GMT Horiba Scientific has released the VS-7000-PDA, a mini fiber optic linear photodiode array (PDA) spectrometer with a UV-VIS range from 200 to 860 nm, http://www.photonics.com/Article.aspx?AID=53890 Wed, 15 May 2013 00:00:00 GMT Spectra-Physics, a Newport Corp. brand, has introduced Explorer One, an ultrasmall actively Q-switched diode-pumped solid-state ultraviolet laser for http://www.photonics.com/Article.aspx?AID=53882 Tue, 14 May 2013 00:00:00 GMT Rudolph Technologies Inc. has released the S3000SX thin-film metrology system for transparent films in semiconductor fabrication applications at the 2 http://www.photonics.com/Article.aspx?AID=53872 Mon, 13 May 2013 00:00:00 GMT Next Instruments’ new MultiScan series 4000 FTNIR spectrometer measures a wide range of organic molecules such as amines, hydrocarbons, aromatic http://www.photonics.com/Article.aspx?AID=53861 Sun, 12 May 2013 00:00:00 GMT