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WEBINARS
Optical Metrology Solutions for the Semiconductor and Microelectronic Industries
NOV
29
11:00 AM EST
This webinar will discuss specific analysis for QC in PCB applications. It will also cover critical dimensional measurement, roughness, defect identification, and quality control. Presenters Adam...
Presented by
SiPM and SPAD: Emerging Applications for Single-Photon Detection
JAN
17
2:00 PM EST
This webinar will provide a thorough overview of silicon photomultipliers (SiPMs) and single-photon avalanche photodiodes (SPADs) for low-light level photodetection. You will gain a better...
Presented by
on
demand
Compact Metadevices for Flat Optical ComponentsInverse-design is a new paradigm that enables engineers to tap into vast parameter space for designing novel photonic and optical devices, including compact metadevices. Inverse-design approaches can...
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