Daily News Briefs

CyberOptics Corp. and Universal Instruments Corp. have signed an agreement to integrate CyberOptics' new embedded process verification (EPV) inspection technology into Universal's Genesis and AdVantis electronic component placement systems that incorporate its new Lightning placement head. The EPV sensor is expected to be introduced later this year. The companies will demonstrate the product at the 2004 APEX/IPC Printed Circuits Expo and Designers Summit this month in Anaheim, Calif. . . . Two professors in the Cornell University College of Engineering have received $50,000 awards from the 2004 Lockheed Martin University Research Grants Program. The recipients are Alyssa B. Apsel, assistant professor of electrical and computer engineering, and Mark Campbell, assistant professor of mechanical and aerospace engineering. Apsel is an expert on merging high-speed CMOS (complementary metal-oxide semiconductor) circuits with photonics. Her research focuses on building high-performance opto-electronic computational microsystems. She received the Lockheed Martin award for her project, "Resonant Monolithic Photodetectors and On-Chip Waveguides for Integrated Optoelectronics." Campbell is an expert in autonomy for complex aerospace systems, such as multiple satellites and autonomous aerial vehicles. He was awarded for his project, "Cooperative Information Seeking for Uninhabited Vehicles." . . . Molecular Imprints Inc. (MII), a manufacturer of step-and-flash (S-FIL) imprint nanolithography equipment for high resolution and 3-D pattern replication, has announced sales of its Imprio 100 tool to South Korea’s new National Nanofab Center at the Korea Institute of Science and Technology and to a global electronics company based in northern California.