FEI Titan Awarded at Nano Tech 2008

FEI Co. of Hillsboro, Ore., announced that its Titan 80-300 S/TEM (scanning/transmission electron microscope) received the award for technical excellence in evaluation and measurement at Nano Tech 2008, a nanotechnology conference held last month in Tokyo. Unlike conventional S/TEMs, which require complex computational procedures to reconstruct high resolution images, FEI said the Titan S/TEM's aberration-corrected electron optics provides directly interpretable image resolution at the atomic scale. "The introduction of aberration-corrected TEM is a major breakthrough that gives scientists the ability to directly visualize nanostructures with sub-angstrom imaging resolution. A new model with high resolution EELS (electron-energy-loss spectroscopy) that can provide analytical results with the same high resolution has also been put into practical use," said professor Tomoji Kawai, chairman of the Nano Tech executive committee. Koyo Iwasaki, country director for FEI Japan, accepted the award.