SEM, STEM

The Handbook of Charged Particle Optics, Second Edition, addresses the design and use of high-resolution instrumentation such as focused ion beam systems, and scanning electron and scanning transmission electron microscopes. The edition features new chapters on aberration correction and applications of gas phase field ionization sources. Up-to-date information on Schottky electron and liquid metal ion sources is presented as well. Jon Orloff, ed.; !%CRC Press/Taylor & Francis Group%!, Boca Raton, Fla., 2008. $149.95.





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