Zeiss Marks CrossBeam’s Anniversary

!%Carl Zeiss Microscopy%! recently celebrated the 10th anniversary of its CrossBeam FIB-SEM (focused ion beam-scanning electron microscope) technology. The ceremony was held at the Center for Composite Materials at the University of Delaware, which has acquired an Auriga 60 CrossBeam workstation for its Interdisciplinary Science and Engineering Laboratory, under construction. The Auriga includes both a Gemini SEM and an FIB column. The SEM column enables the Auriga to create high-resolution nanoscale images, while the FIB column allows it to remove material from the sample by ion milling.