B&W Tek Receives Patent

!%B&W Tek Inc.%! of Newark, Del., has been awarded US Patent No. 8,135,249 for a fiber optic probe that mounts directly above the objective lens of a microscope to add spectroscopic function with minimal alteration to the optical path. The probe and microscope can perform Raman and fluorescence analysis as well as microsampling using easily reconfigurable excitation wavelengths. This is the company’s 18th patent since its establishment in 1997. It produces optical spectroscopy, laser instrumentation and portable/lab-grade Raman systems.