Optical Lithography Aims for 157 nm
Doug Anberg and Warren Flack
Reducing the design rules of seminconductor devices enables smaller components and represents the most economical means for the industry to reduce costs while improving device performance. This economic driver is at the root of each advancement in optical lithography and continues to produce smaller and smaller critical dimensions.
Phase-shift mask techniques and optical proximity correction have allowed the semiconductor industry to extend 248-nm KrF technology - first introduced for the 250-nm node - down to sub- 180-nm design rules. Similarly, industry leaders expect that 193-nm ArF technology, entering production this year, will extend below 120 nm...
LATEST NEWS
- CLEO Heads to the East Coast
Apr 29, 2024
- Laser-Based Gas Analyzer Developed to Detect Air Pollution
Apr 29, 2024
- Qubits Could be Stored in Flash-Like Memory
Apr 29, 2024
- Exail Signs LLNL Contract, Partners with Eelume
Apr 26, 2024
- Menlo Moves U.S. HQ: Week in Brief: 4/26/2024
Apr 26, 2024
- Optofluidics Platform Keys Label-, Amplification-Free Rapid Diagnostic Tool
Apr 25, 2024
- DUV Lasers Made with Nonlinear Crystals Enhance Lithography Performance
Apr 25, 2024
- Teledyne e2v, Airy3D Collaborate on 3D Vision Solutions
Apr 24, 2024