Candela Instruments Introduces Automated Surface Inspection System for Optoelectronic Substrates
FREMONT, Calif., Aug. 13 -- Candela Instruments announces the
availability of an Optical Surface Analyzer (OSA) for substrates used in the
manufacture of active and passive optoelectronic devices. The C1 offers a
combination of surface inspection and metrology applications, making
it a versatile system for substrate qualification, yield
improvement or contamination control.
Available with manual or automated handling for up to 200-mm-diam substrates, the C1 is suitable for use in laboratories, pilot lines or
volume manufacturing lines.
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