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Candela Instruments Introduces Automated Surface Inspection System for Optoelectronic Substrates

Photonics.com
Aug 2001
FREMONT, Calif., Aug. 13 -- Candela Instruments announces the availability of an Optical Surface Analyzer (OSA) for substrates used in the manufacture of active and passive optoelectronic devices. The C1 offers a combination of surface inspection and metrology applications, making it a versatile system for substrate qualification, yield improvement or contamination control.
   Available with manual or automated handling for up to 200-mm-diam substrates, the C1 is suitable for use in laboratories, pilot lines or volume manufacturing lines.

GLOSSARY
metrology
The science of measurement, particularly of lengths and angles.
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