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Newport Granted Second Patent on Core Technology to Enhance Semiconductor Equipment Manufacturing

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IRVINE, Calif., Aug. 28 -- Newport Corporation announced that it has been issued its second US patent in a series of patent applications that extend the company's leadership in next-generation technology in the fabrication of semiconductor equipment products. Newport's US Patent, covering improvements in 300 mm edge-grip robotic end effectors, includes technology that allows semiconductor equipment manufacturers to efficiently and reliably handle 300 mm wafers during fabrication and testing. The patent strengthens and deepens Newport's protection of its properties in this field and represents...Read full article

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    Published: August 2001
    Glossary
    metrology
    Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
    metrologyNews & Features

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