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Stabilized Laser Source Is Key to Interferogram

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A researcher from CSO Mesure in Grenoble, France, has produced a high-frequency laser source that could prove useful in next-generation interferometric spectrometers.
Developed as part of a project to take metrology readings from space, CSO's laser had to meet a number of specified requirements. The laser had to have optical compatibility with a Michelson interferometer operating within the 3.6- to 15.5-µm wavelength range, and it required high stability for operating in space.
The resulting diode laser, emitting at 1537.6 nm, exhibited short-term wavelength stability (few minutes) of ±3 3 10210 and long-term wavelength stability (2000 hours) of ±6 3 1028. It also featured power consumption less than 5.5 W.
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Published: January 1998
Glossary
metrology
Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
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