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Veeco Buys Atomic Force Microscope Probe Unit

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WOODBURY, N.Y., June 10 -- Veeco Instruments Inc. has purchased the atomic force microscope (AFM) probe business of NanoDevices Inc., based in Santa Barbara, Calif. Terms of the transaction were not disclosed. Don Kania, PhD, president of Veeco, said, "This strategic technology acquisition will help Veeco provide its customers with probes designed specifically to maximize the performance of Veeco's AFMs, and will accelerate our development of new AFM products where innovative probe technology can be the critical element." Stephen Minne, president of NanoDevices, added, "Veeco has been an...Read full article

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    Published: June 2003
    Glossary
    atomic force microscope
    An atomic force microscope (AFM) is a high-resolution imaging and measurement instrument used in nanotechnology, materials science, and biology. It is a type of scanning probe microscope that operates by scanning a sharp tip (usually a few nanometers in diameter) over the surface of a sample at a very close distance. The tip interacts with the sample's surface forces, providing detailed information about the sample's topography and properties at the nanoscale. Key features and principles of...
    metrology
    Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
    AFMatomic force microscopeatomic force microscope probesBasic ScienceCommunicationsmetrologyMicroscopynanodevicesNews & FeaturesVeeco Instruments

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