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Insight Analytical announced it has expanded its analytical capabilities to include optical profilometry, Fourier transform infrared spectroscopy and ellipsometry. These new tools enable measurements of topography and dimensions of surface structures, identification of organic materials and film-thickness measurements. The Santa Barbara, Calif.-based company, a subsidiary of Innovative Micro Technology, provides surface and chemical materials characterization, process/design verification, competitive analysis and failure analysis to the MEMS, semiconductor, data storage, electronics and chemical industries.   . . .   Fischer Imaging Corp. has moved its European headquarters to Geneva, Switzerland, and has established direct subsidiaries in Germany, Italy, France and the UK. The company, which previously sold its digital breast imaging systems through strategic partnerships, said it has expanded its European presence during the past year with SenoScan mammography systems installed in Germany, Italy, France, Sweden and the UK.   . . .   Measurement Microsystems, of Montreal, Quebec, and Data Optics Inc., of Ypsilanti, Mich., announced they have formed a partnership to distribute MM's software package, MM Spectra, which enhances the spectral resolution of existing or new spectrometers by a factor of up to 10 in real time and allows real-time, in situ recalibration of spectrometers.
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Published: August 2003
Glossary
ellipsometry
Ellipsometry is an optical technique used to characterize the properties of thin films and surfaces. It is based on the measurement of changes in the polarization state of light reflected or transmitted from a sample. In ellipsometry, polarized light is typically directed at an angle onto the surface of the sample. As the light interacts with the sample's surface and any thin films present, its polarization state changes. By precisely measuring these changes in polarization, ellipsometry can...
Data Opticsellipsometryfischer imagingFTIR spectroscopyInnovative Micro TechnologyInsight AnalyticalMeasurement MicrosystemsNews BriefsPhotonics Tech Briefsspectroscopy

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