Search
Menu
Bristol Instruments, Inc. - 872 Series High-Res 4/24 LB

Daily News Briefs

Facebook X LinkedIn Email
Insight Analytical announced it has expanded its analytical capabilities to include optical profilometry, Fourier transform infrared spectroscopy and ellipsometry. These new tools enable measurements of topography and dimensions of surface structures, identification of organic materials and film-thickness measurements. The Santa Barbara, Calif.-based company, a subsidiary of Innovative Micro Technology, provides surface and chemical materials characterization, process/design verification, competitive analysis and failure analysis to the MEMS, semiconductor, data storage, electronics and...Read full article

Related content from Photonics Media



    Articles


    Products


    Photonics Handbook Articles


    White Papers


    Webinars


    Photonics Dictionary Terms


    Media


    Photonics Buyers' Guide Categories


    Companies
    Published: August 2003
    Glossary
    ellipsometry
    Ellipsometry is an optical technique used to characterize the properties of thin films and surfaces. It is based on the measurement of changes in the polarization state of light reflected or transmitted from a sample. In ellipsometry, polarized light is typically directed at an angle onto the surface of the sample. As the light interacts with the sample's surface and any thin films present, its polarization state changes. By precisely measuring these changes in polarization, ellipsometry can...
    Data Opticsellipsometryfischer imagingFTIR spectroscopyInnovative Micro TechnologyInsight AnalyticalMeasurement MicrosystemsNews BriefsPhotonics Tech Briefsspectroscopy

    We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.