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Chandra Vikram, senior research scientist and research professor at the Center for Applied Optics, The University of Alabama in Huntsville, received the 2003 Dennis Gabor Award from the International Society for Optical Engineering (SPIE), presented at SPIE's 48th annual meeting this month, for his contributions to the science and technology of speckle metrology, particle field holography, multicolor holography, interferometry and holographic vibration analysis.   . . .   Steven Patterson, a professor of precision engineering at the University of North Carolina at Charlotte, has been selected...Read full article

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    Published: August 2003
    Glossary
    metrology
    Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
    Center for Applied OpticsInternational Society for Optical EngineeringLawrence Livermore National LaboratorymetrologyNews BriefsOpticsPhotonics Tech BriefsThe University of Alabama in HuntsvilleUniversal Display

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