PISCATAWAY, N.J. & SAN JOSE, Calif., June 9 -- Semiconductor Equipment and Materials International (SEMI) and the Institute of Electrical and Electronics Engineers Standards Association (IEEE) have signed a memorandum of understanding to support each other's programs to create nanotechnology and microelectromechanical systems (MEMS) standards. The agreement marks the first standards collaboration between the two organizations.
Under the memorandum, SEMI and IEEE will appoint liaisons, define a regular exchange of information and schedule periodic joint meetings. They will also presenting updates of their respective committee meetings and disseminate standards information on nanotechnology and MEMS.
The IEEE Standards Association has an active nanotechnology standards effort underway and expects to publish a measurement standard for carbon nanotubes in 2005. Similarly, SEMI's MEMS Initiative includes a focus on standards.
"The memorandum will give SEMI and IEEE greater traction in developing suites of standards for nanotechnology, MEMS and other emerging fields that will enhance electronic device performance," said Judith Gorman, managing director of the IEEE Standards Association. "Possible areas of focus include organic, molecular, carbon nanotube and silicon nanofiber-based devices. We see this memorandum as the start of a long-term collaboration, one that links the complementary expertise of our organizations to benefit our members and industry as a whole."
SEMI is a global industry association serving companies that develop and provide manufacturing technology and materials to the global semiconductor, flat panel display, MEMS and related microelectronics industries. Its standards program encompasses semiconductor process equipment and materials from wafer manufacturing, test, assembly and packaging to the manufacture of flat panel displays and MEMS. SEMI has a presence in major markets for high-tech production, especially in semiconductors, an important area for nanotechnology.
IEEE-SA develops industry standards in a wide variety of industries. In addition to its work on carbon nanostructure standards, it recently completed a standard that creates a uniform framework for evaluating organic field effect transistors (OFET) as a platform for high-volume manufacturing. The IEEE is now extending its OFET activities to device standards.
For more information, visit: www.semi.org