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Optical Metrology: Nanopositioning's Throughput Logjam

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Scott Jordan, PI; Monica Bar-Sever, Small Planet Photonics; and Brian Betts, National Instruments Inc.

It is not uncommon for scanning, alignment and spectroscopy applications to involve piezoelectric nanopositioning stages. One typical requirement, measurement of optical signals that vary rapidly as a function of position or time, isn't as simple as it sounds, though. Throughput problems are fairly common because optical power metrology technology has not kept up with advances in positioning technology. The specific culprits include long latencies, slow sampling, limited bandwidth, leisurely autoranging and poor communications speeds. In the past, such limitations required processes to be...Read full article

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    Published: July 2004
    Glossary
    metrology
    Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
    scanning
    The successive analysis or synthesizing of the light values or other similar characteristics of the components of a picture area, following a given method.
    Accent on ApplicationsalignmentApplicationsBasic ScienceCommunicationsmetrologyoptical power metrology technologypiezoelectric nanopositioning stagesscanningSensors & Detectorsspectroscopy applications

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