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EM Optomechanical Inc., an Albequerque, N.M., manufacturer of a 3-D MEMS (microelectromechanical systems) profiler -- a metrology instrument based on long working-distance interference microscope technology -- has delivered its first profiler to Auburn University's college of engineering. The OPTOPro Model 622A, intended for microsystems researchers, makes real-time dynamic measurements of the microscale and nanoscale motions of MEMS devices and other microsystems. EM Optomechanical, which spun off from Optomec Inc. in 1998 to provide optomechanical engineering, design and fabrication...Read full article

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    Published: July 2005
    Glossary
    metrology
    Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
    Auburn UniversityEM OptomechanicalIEEEindustriallong working-distance interference microscopeMEMSmetrologyMicroscopyNews BriefsPhotonics Tech Briefs

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