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A Small Temperature Probe with a Bright Future

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Hank Hogan

To measure temperature on the nanoscale, you need a minuscule thermometer. Now a group of researchers has demonstrated that a fluorescent particle glued to the end of a sharp tip of an atomic force microscope might do the trick. By monitoring changes in the fluorescence of the particle, the team showed that the effect of a 200-nm-wide heater reached out 10 times its width. Team member Lionel Aigouy, a researcher working for the Centre National de la Recherche Scientifique at École Supérieure de Physique et de Chimie Industrielles of Paris, noted that the fluorescent probe method was...Read full article

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    Published: March 2008
    Glossary
    atomic force microscope
    An atomic force microscope (AFM) is a high-resolution imaging and measurement instrument used in nanotechnology, materials science, and biology. It is a type of scanning probe microscope that operates by scanning a sharp tip (usually a few nanometers in diameter) over the surface of a sample at a very close distance. The tip interacts with the sample's surface forces, providing detailed information about the sample's topography and properties at the nanoscale. Key features and principles of...
    atomic force microscopeBasic ScienceenergyFeaturesfluorescent particleMicroscopynanoscaleSensors & Detectors

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