Search
Menu
DataRay Inc. - ISO 11146-Compliant Laser Beam Profilers

Leica Buys Bal-Tec

Facebook X LinkedIn Email
Leica Microsystems GmbH has bought Bal-Tec AG of Balzers, Liechtenstein, a producer of instruments for sample preparation in scanning electron microscopy. The acquisition will expand the German company’s electron microscopy sample preparation business and will be managed from Leica’s ultramicrotomy site in Vienna, Austria.
Rocky Mountain Instruments - Laser Optics MR

Published: April 2008
Glossary
scanning electron microscopy
Scanning electron microscopy (SEM) is an advanced imaging technique used in microscopy to obtain high-resolution, three-dimensional images of the surfaces of solid specimens. SEM achieves this by using a focused beam of electrons to scan the specimen's surface, resulting in detailed images with magnifications ranging from about 10x to 100,000x or higher. Key features and principles of scanning electron microscopy include: Electron beam: SEM uses an electron beam instead of visible light for...
Euro NewsEuropeLeica Microsystems GmbHMicroscopyNewsscanning electron microscopyultramicrotomy

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.