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Leica Acquires Bal-Tec

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Leica Microsystems of Wetzlar, Germany, has acquired Bal-Tec AG of Balzers, Liechtenstein, a producer of sample preparation instruments for scanning electron microscopy. The acquisition will expand the German company’s electron microscopy sample preparation business and will be managed from Leica’s ultramicrotomy site in Vienna, Austria.
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Published: April 2008
Glossary
scanning electron microscopy
Scanning electron microscopy (SEM) is an advanced imaging technique used in microscopy to obtain high-resolution, three-dimensional images of the surfaces of solid specimens. SEM achieves this by using a focused beam of electrons to scan the specimen's surface, resulting in detailed images with magnifications ranging from about 10x to 100,000x or higher. Key features and principles of scanning electron microscopy include: Electron beam: SEM uses an electron beam instead of visible light for...
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