Peter de Groot Elected SPIE Fellow
Peter de Groot, PhD, director of research and development for Zygo Corp., has been elected a SPIE fellow for his many contributions to high-precision interferometry. "Dr. de Groot is the inventor and developer of optical metrology tools for inspecting a range of optical and engineering surfaces from MEMS (microelectromechanical systems) devices to airplane wings -- with more than 75 patents issued and pending and four R&D 100 Awards to his name, he is truly a prolific and leading inventor in the optical metrology arena," SPIE said in a statement. Zygo Corp. is based in Middlefield, Conn., and manufactures optical metrology instruments, precision optics and electro-optics for the semiconductor and industrial markets. SPIE will honor 72 new fellows this year for their contributions to optics, photonics and imaging.