Asylum, ORNL to Hold SPM Workshop
SANTA BARBARA, Calif., April 6, 2010 — The Center for Nanophase Materials Sciences at Oak Ridge National Laboratory (ORNL) and Asylum Research are co-organizing the International Workshop for Scanning Probe Microscopy for Energy Applications, to be held at ORNL Sept. 15-17, 2010.
The workshop of invited and contributed talks will cover the recent advances in characterization of energy-relevant materials systems using scanning probe microscopy (SPM) and atomic force microscopy (AFM) techniques, as well as the state-of-the-art in energy dissipation and transformation measurements by SPM/AFM.
The three-day event will include a poster session, as well as an equipment lab and hands-on tutorials for demonstration of recently developed dynamic and multispectral SPM/AFM modes on the company’s Cypher and MFP-3D SPM/AFMs.
David Ginger of the University of Washington will lead the keynote talk on “Local Probing of Carrier Dynamics in Polymer Photovoltaic Materials.”
Major topics to be addressed at the event will include:
• Mapping of carrier dynamics and photo-induced behavior of photovoltaic materials
• Ionic and electronic transport in fuel cells and Li-ion batteries
• Energy harvesting by piezoelectric and ferroelectric systems
• Novel advances in functional probes, including microwave, thermal and conductive
• Imaging energy transformations and dissipation by multimodal and Band Excitation SPM/AFM
The purpose of the workshop is to build a network of materials scientists centered on the applications of SPM for energy problems and to promote rapid dissemination of theoretical knowledge, experimental protocols and novel technique development in the area, said Sergei Kalinin of the ORNL’s Center for Nanophase Materials Sciences.
For more information, visit: www.asylumresearch.com
- That property of particular materials that determines that they will be polarized in one direction or the other, or reversed in direction, when a positive or negative electric field is applied, remaining so until disturbed.
- An electromagnetic wave lying within the region of the frequency spectrum that is between about 1000 MHz (1 GHz) and 100,000 MHz (100 GHz). This is equivalent to the wavelength spectrum that is between one millimeter and one meter, and is also referred to as the infrared and short wave spectrum.
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